• On-device cryogenic quenching enables robust amorphous tellurium for threshold switching
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  • 2026-02-11 10:09:50|
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ㅇ [Title]         On-device cryogenic quenching enables robust amorphous tellurium for threshold switching


ㅇ [Journal]     Nature Communications                                                                                                          


 [Author]     Namwook Hur, Seunghwan Kim, Yu Bin Park, Changhwan Kim, Sohui Yoon, Youngseok Cho, Tae Hoon Lee*, Joonki Suh*

 
 
 [Abstrct]


Amorphous chalcogenide alloys have gained immense interest in their ovonic threshold switching. Yet, understanding device-level elemental behaviour, particularly for tellurium (Te),

has been hindered by its intrinsic low crystallization temperature and poor glass-forming ability. To overcome this challenge, the research team realized a robust amorphous Te (a-Te)

via on-device cryogenic quenching, which successfully suppresses crystallization from the supercooled liquid at low ambient temperature.


 
As a result, the ordered-to-disordered phase transition yields a threshold-voltage increase and a lower subthreshold current via enhanced deep-level trap formation. Moreover, by

preventing high operational currents, the a-Te exhibits self-regulated oscillation behaviour driven through deep-level defects.  
These findings support the conclusion that threshold

switching in Te originates from defect-mediated transitions before melting, rather than solely from thermal phase-change effects.



Our results provide insights into chalcogenide switching mechanisms and pave the way for stoichiometry-tuned selector devices, nano-oscillators, and selector-only memory

applications.



 
 
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